Substitution of defective readout circuits in imagers

Details Substitution of defective readout circuits in imagers Substitution of defective readout circuits in imagers

2004-12-14

2010-12-14

Ometz, David L (Department: 2622)

Television

Camera, system and detail

Solid-state image sensor

C348S319000, C348S241000, C348S246000, C250S208100

Reexamination Certificate

active

07852391

ABSTRACT:
An imaging system configured with readout circuit redundancy is disclosed. Pixel data from a particular column can be steered around a defective readout circuit to an operational readout circuit. Thus, larger imaging arrays which are generally more prone to common column circuitry defects are enabled. In addition, imaging systems configured with significant on-chip signal processing, which are also more prone to common column circuitry defects, are enabled. The occurrence of lost pixel data from an entire column is eliminated or otherwise reduced, thereby increasing overall operability and yield of the imaging system. The system can be implemented on a single chip or a chip set.

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