1982-03-22
1984-05-08
Schreyer, Stafford D.
H04B 346, H04M 330
Patent
active
044476795
ABSTRACT:
A testing system connects a subscriber line to be tested by way of a semiconductor switch of a type driven by a constant current to a test equipment to test a subscriber line and a terminal equipment. The test system includes a compensation circuit having means for measuring a constant current component contained in a current flowing through the semiconductor switch into a test line, and means for drawing a constant current component to drive the switch through the test line on the basis of the measuring result to supply the current component obtained by subtracting the constant current component from the current flowing through the test line to the testing equipment.
REFERENCES:
patent: 4076971 (1978-02-01), Mukaemachi et al.
Kojima Takafumi
Mizoguchi Masayuki
Yoshida Shigeru
Hitachi , Ltd.
Nippon Telegraph & Telephone Public Corporation
Schreyer Stafford D.
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