Sub volt flash memory system

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S230060

Reexamination Certificate

active

07990773

ABSTRACT:
Various circuits include MOS transistors that have a bulk voltage terminal for receiving a bulk voltage that is different from a supply voltage and ground. The bulk voltage may be selectively set so that some MOS transistors have a bulk voltage set to the supply voltage or ground and other MOS transistors have a bulk voltage that is different. The bulk voltage may be set to forward or reverse bias pn junctions in the MOS transistor. The various circuits include comparators, operational amplifiers, sensing circuits, decoding circuits and the other circuits. The circuits may be included in a memory system.

REFERENCES:
patent: 6282145 (2001-08-01), Tran et al.
patent: 6788608 (2004-09-01), Tran et al.
patent: 7139196 (2006-11-01), Tran
patent: 7239557 (2007-07-01), Ha
patent: 7405988 (2008-07-01), Tran et al.
patent: 2007/0070703 (2007-03-01), Tran et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sub volt flash memory system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sub volt flash memory system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sub volt flash memory system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2708806

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.