Measuring and testing – Sampler – sample handling – etc. – With heating or cooling
Patent
1985-03-25
1987-07-07
Bashore, S. Leon
Measuring and testing
Sampler, sample handling, etc.
With heating or cooling
7386323, 7386434, 55269, 55327, 55429, 62 555, 422101, 436177, B01D 5000, B01D 4705
Patent
active
046778632
ABSTRACT:
Apparatus and method steps for collecting sub-micron sized particles include a collection chamber and cryogenic cooling. The cooling is accomplished by coil tubing carrying nitrogen in liquid form, with the liquid nitrogen changing to the gas phase before exiting from the collection chamber in the tubing. Standard filters are used to filter out particles of diameter greater than or equal to 0.3 microns; however the present invention is used to trap particles of less than 0.3 micron in diameter. A blower draws air to said collection chamber through a filter which filters particles with diameters greater than or equal to 0.3 micron. The air is then cryogenically cooled so that moisture and sub-micron sized particles in the air condense into ice on the coil. The coil is then heated so that the ice melts, and the liquid is then drawn off and passed through a Buchner funnel where the liquid is passed through a Nuclepore membrane. A vacuum draws the liquid through the Nuclepore membrane, with the Nuclepore membrane trapping sub-micron sized particles therein. The Nuclepore membrane is then covered on its top and bottom surfaces with sheets of Mylar.RTM. and the assembly is then crushed into a pellet. This effectively traps the sub-micron sized particles for later analysis.
REFERENCES:
patent: 2553143 (1951-05-01), McNeely
patent: 3024009 (1962-03-01), Booth, Jr. et al.
patent: 3258932 (1966-07-01), Kern
patent: 3343344 (1967-09-01), Fairaizl et al.
patent: 3788096 (1974-01-01), Brilloit
patent: 4506513 (1985-03-01), Max
patent: 4530250 (1985-07-01), Gay et al.
Gay Don D.
McMillan William G.
Anderson Andrew J.
Bashore S. Leon
Hightower Judson R.
The United States of America as represented by the United States
Westerdahl Allen F.
LandOfFree
Sub-micron particle sampler apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sub-micron particle sampler apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sub-micron particle sampler apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1655909