Sub-micron chemical imaging with near-field laser desorption

Details Sub-micron chemical imaging with near-field laser desorption Sub-micron chemical imaging with near-field laser desorption

1996-04-05

2000-06-27

Soderquist, Arlen

Chemistry: analytical and immunological testing

Nuclear magnetic resonance, electron spin resonance or other...

436181, 250282, 250288, B01D 5944, H01J 4900

Patent

active

060805862

ABSTRACT:
The present invention discloses an improved method and apparatus for analyzing the surface of materials using sub-micron laser desorption gas phase analysis. The method uses a combination of Near-field Optical Microscopy and Time-of Flight Mass Spectroscopy.

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