Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate
2005-12-06
2005-12-06
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Junction field effect transistor
C257S347000, C257S352000, C438S517000
Reexamination Certificate
active
06972448
ABSTRACT:
A low resistance buried back contact for SOI devices. A trench is etched in an insulating layer at minimum lithographic dimension, and sidewalls are deposited in the trench to decrease its width to sublithographic dimension. Conducting material is deposited in the trench, which serves as a low-resistance contact to the back side of the device. In another embodiment, the trench-fill material is separated from the device by an insulating layer, and serves as a back gate structure.
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patent: 6759315 (2004-07-01), Furukawa et al.
Brady III Wade James
Flynn Nathan J.
Mandala Jr. Victor A.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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