Sub-diffraction limit resolution in microscopy

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S368000, C359S385000

Reexamination Certificate

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11001104

ABSTRACT:
A method and apparatus for visualizing sub-micron size particles employs a polarizing microscope wherein a focused beam of polarized light is projected onto a target, and a portion of the illuminating light is blocked from reaching the specimen, whereby to produce a shadow region, and projecting diffracted light from the target onto the shadow region.

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