Structure of semiconductor element and its manufacturing...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For high frequency device

Reexamination Certificate

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C257S301000, C257S309000, C257S295000, C257S308000, C257S310000

Reexamination Certificate

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07034396

ABSTRACT:
A semiconductor element includes a semiconductor substrate; a film of electrode material on the substrate at a thickness corresponding to the height of a pair of confronting electrodes standing vertical; a gap in the film of electrode material at a position so that confronting surfaces of the electrodes are formed as having a width corresponding to an interval of the confronting surfaces of the electrodes; and an insulating film in the gap. Then, a pair of confronting electrodes is formed by etching the film of electrode material. An intermediate film is formed on the pair of confronting electrodes; plugs are connected to the pair of confronting electrodes through the intermediate film; and finally wiring is connected to the plugs.

REFERENCES:
patent: 5652165 (1997-07-01), Lu et al.
patent: 6232199 (2001-05-01), Wei
patent: 6403416 (2002-06-01), Huang et al.
patent: 2003/0183862 (2003-10-01), Jin et al.
patent: 06-077430 (1994-03-01), None
patent: 2001-257316 (2001-09-01), None
patent: 2002-299555 (2002-10-01), None

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