Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-04-04
2006-04-04
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S667000
Reexamination Certificate
active
07023221
ABSTRACT:
The present invention offers an object proximity detector and an object position detector. The variation of frequency of an oscillator is used to detect the proximity of an object to the sensor plates. The dependence of frequency on process parameter is minimized by a compensation capacitor. It is not need to calibrate the product during the manufacture. In order to magnify the sensitivity, the sensor plates are placed in the feedback loop of the oscillator, instead of at the input of the oscillator. The independence of the process parameter and increasing of the sensitivity can be achieved by adding the compensation capacitor and place the sensor plates in the feedback loop at the same time. Multiple transmission gates are connected to the input and the output of the oscillator, and the sensor plates are connected to the transmission gates to form an object position detector.
REFERENCES:
patent: 6724324 (2004-04-01), Lambert
patent: 2004/0043696 (2004-03-01), Suzuki
Benson Walter
Holylite Microectronics Corporation
Perkins Coie LLP
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