Structure monitor system

Details Structure monitor system Structure monitor system

2003-07-02

2009-06-02

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Mechanical measurement system

C702S036000

Reexamination Certificate

active

07542856

ABSTRACT:
A structure monitor system comprising a measuring unit3for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor2laid on the boundary of the structure, numerical analysis unit5for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit6for displaying information on an analysis distortion by the numerical analysis unit5in a association with a position on the structure S.

REFERENCES:
patent: 4650281 (1987-03-01), Jaeger et al.
patent: 2004/0246489 (2004-12-01), Kinugasa et al.
patent: 5-062081 (1993-03-01), None
patent: 5-231956 (1993-09-01), None
patent: 11-287650 (1999-10-01), None
patent: 2002-340741 (2002-11-01), None
English Translation of JP 2002-340741, Nov. 2002.

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