Measuring and testing – Vibration – Sensing apparatus
Reexamination Certificate
2005-04-19
2005-04-19
Williams, Hezron (Department: 2856)
Measuring and testing
Vibration
Sensing apparatus
C073S600000, C073S602000, C073S643000
Reexamination Certificate
active
06880403
ABSTRACT:
An internal condition of a concrete structure is objectively evaluated irrespective of surrounding noise or the shape of a hammer, by placing a vibration sensor in direct contact with a measuring surface so as to directly convert a vibration generated on the measuring surface into a corresponding voltage without the intervention of a medium such as air thereby to quantify the vibration generated on the measuring surface concerned. A structure diagnosis apparatus of the present invention includes a vibration unit for generating an elastic wave in a measuring object of a concrete structure, a vibration detector adapted to be placed in contact with a surface of the measuring object for detecting a component in a predetermined frequency range of an elastic vibration generated on the surface of the measuring object by the vibration unit; and a display device for displaying a maximum amplitude of an output signal of the vibration detector.
REFERENCES:
patent: 3580056 (1971-05-01), Warner
patent: 3859847 (1975-01-01), Ronemus
patent: 3867836 (1975-02-01), Sessler et al.
patent: 4163393 (1979-08-01), Gutierrez et al.
patent: 4185180 (1980-01-01), Anderson
patent: 4479389 (1984-10-01), Anderson et al.
patent: 4599898 (1986-07-01), Beer
patent: 4679033 (1987-07-01), Hwang
patent: 4699006 (1987-10-01), Boxenhorn
patent: 5054606 (1991-10-01), Musschoot
patent: 5152401 (1992-10-01), Affeldt et al.
patent: 5442961 (1995-08-01), Bozeman, Jr.
patent: 5503010 (1996-04-01), Yamanaka
patent: 5612495 (1997-03-01), Shimada et al.
patent: 5808202 (1998-09-01), Passarelli, Jr.
patent: 5880351 (1999-03-01), Orita et al.
patent: 6234022 (2001-05-01), Tadokoro
patent: 6298729 (2001-10-01), Locker et al.
patent: 6553837 (2003-04-01), Lysen
patent: 6591681 (2003-07-01), Shimada et al.
patent: 6629448 (2003-10-01), Cvancara
Matsuhashi Kanji
Shimada Takashi
Matsuhashi Techno Research Co., Ltd.
Saint-Surin Jacques M.
Sughrue & Mion, PLLC
Williams Hezron
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