Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-07-11
2006-07-11
Mehta, Bhavesh M. (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S199000, C382S149000, C382S203000
Reexamination Certificate
active
07076093
ABSTRACT:
A structure-guided transformation transforms a region of an image into a region in the structure-transformed image according to the desired structure. The invention achieves efficient and accurate structure-guided processing such as filtering, detection and comparison in the transformed domain and thereby facilitates use of simple operations to enhance or detect straight lines or edges. Structure information is used to enhance and detect image features of interest even when the shape of the image structure is not regular. Both global and local structures of objects can be inspected. Global structure inspection detects gross errors in image structure; therefore side effects caused by mismatched structure-guided processing are avoided. Subtle defects along the edge of a structure can be detected by local structure inspection. Structure information guidance provides an edge detection inspection system that tolerates significant noise and contrast variations.
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Lee Shih-Jong J.
Oh Seho
Mehta Bhavesh M.
Strege John B.
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