Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2011-06-21
2011-06-21
Evans, F. L (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
C977S712000
Reexamination Certificate
active
07965388
ABSTRACT:
A structure for surface enhanced Raman spectroscopy is disclosed herein. A substrate has a stack configured vertically thereon. The stack encompasses at least two metal layers and at least one dielectric layer therebetween. Each layer of the stack has a controlled thickness, and each of the at least two metal layers is configured to exhibit a predetermined characteristic of plasmonic resonance.
REFERENCES:
patent: 7307719 (2007-12-01), Wang et al.
patent: 7402531 (2008-07-01), Kuekes et al.
patent: 7483130 (2009-01-01), Baumberg et al.
patent: 2006/0038990 (2006-02-01), Habib et al.
patent: 2006/0274315 (2006-12-01), Saito
patent: 2007/0177139 (2007-08-01), Kamins et al.
patent: 2009/0027668 (2009-01-01), Fujimaki et al.
Li Zhiyong
Tang Jing
Wu Wei
Xia Qiangfei
Evans F. L
Hewlett--Packard Development Company, L.P.
LandOfFree
Structure for surface enhanced raman spectroscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Structure for surface enhanced raman spectroscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure for surface enhanced raman spectroscopy will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2711705