Structure for suppression of field inversion caused by charge bu

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

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257409, 257499, 257646, H02L 4500

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active

053748336

ABSTRACT:
The invention relates to an integrated circuit including one or more amorphous silicon layers for neutralizing charges which occur in various dielectric layers during fabrication. The amorphous silicon layers include dangling silicon bonds which neutralize charges which would otherwise cause isolation breakdown, impair integrated circuit performance and increase manufacturing costs.

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"Improvement Of Endurance to Hot Carrier Degradation", Yoshida et al., IEEE, 1988, pp. 22-25.

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