Structure for phase change memory and the method of forming...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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C257SE45002

Reexamination Certificate

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08084761

ABSTRACT:
A phase change device includes a first contact electrode structure a phase change material and a first insulating material between the phase change material and the first contact electrode structure and a second contact electrode in contact with the phase change material. A contact structure formed in the first insulating material between the first contact electrode structure and the phase change material is also included. The contact structure is formed by an insulating material breakdown process. A method of forming a phase change device is also described.

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patent: 6111264 (2000-08-01), Wolstenholme et al.
patent: 6114713 (2000-09-01), Zahorik
patent: 6579760 (2003-06-01), Lung
patent: 6872963 (2005-03-01), Kostylev et al.
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patent: 2004/0037179 (2004-02-01), Lee
patent: 2005/0032319 (2005-02-01), Dodge
patent: 2005/0045915 (2005-03-01), Lee
patent: 2006/0054996 (2006-03-01), Dennison

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