Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing
Reexamination Certificate
2008-05-23
2011-10-11
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
C716S137000, C716S138000, C331S057000, C331S176000, C331S185000, C331S186000
Reexamination Certificate
active
08037431
ABSTRACT:
A design structure embodied in a machine readable medium used in a design process includes an interleaved voltage-controlled oscillator, including a ring circuit of main logic inverter gates; a plurality of delay elements connected in parallel with a selected sequence of the main logic inverter gates; wherein each delay element comprises a feedforward section, comprising controls for regulating signal transmission through feedforward elements responsive to one or more control voltages; and a proportional section for regulating signal transmission through at least one logic inverter gate; at least one temperature compensation circuit responsive to a compensating voltage input that is proportional to temperature; an electronic circuit in communication with the temperature compensation circuit and configured to provide a voltage signal responsive to temperature; an amplifier in connection with the electronic circuit to amplify the voltage signal; and a DC offset generator configured to adjust the voltage of the amplified voltage signal.
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Boerstler David W.
Hailu Eskinder
Qi Jieming
Shen Mike
Cantor & Colburn LLP
International Business Machines - Corporation
Siek Vuthe
Talpis Matthew
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