Structure for couple noise characterization using a single...

Details Structure for couple noise characterization using a single... Structure for couple noise characterization using a single...

2011-06-07

2011-06-07

Lin, Sun J (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Logic design processing

C716S100000, C716S108000, C716S110000, C716S111000, C716S113000, C716S115000

Reexamination Certificate

active

07958471

ABSTRACT:
A design structure for a computer-aided design system for generating a functional design model of an integrated circuit design (having nets comprising wires) determines critical parameters for coupling noise between the wires of the nets and acceptable limits for the critical parameters. Further, methods herein include designing a ring oscillator to have stages, each of the stages measuring only one of the critical parameters. This ring oscillator is then included within an integrated circuit design and associated design structure. The embodiments herein produce an integrated circuit according to this integrated circuit design and operate the ring oscillator within the integrated circuit to measure the critical parameters of the integrated circuit and produce test results. These test results are output to determine whether the test results are within the acceptable limits.

REFERENCES:
patent: 5841670 (1998-11-01), Swoboda
patent: 5862365 (1999-01-01), Modo et al.
patent: 5898862 (1999-04-01), Vajapey
patent: 6499131 (2002-12-01), Savithri et al.
patent: 6574127 (2003-06-01), Hsu et al.
patent: 6785626 (2004-08-01), Corr
patent: 6785627 (2004-08-01), Corr
patent: 6785628 (2004-08-01), Corr
patent: 2003/0200046 (2003-10-01), Corr
Ogasahara et al.,“Measurement and Analysis of Inductive Coupling Noise in 90 nm Global Interconnects”, Mar. 2008, IEEE Journal of Solid-State Circuits, vol. 43, No. 3, pp. 718-728.

Affiliated with

Also associated with

Rating

Structure for couple noise characterization using a single... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Structure for couple noise characterization using a single..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure for couple noise characterization using a single... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2626355