Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2011-01-25
2011-01-25
Schechter, Andrew (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C700S299000
Reexamination Certificate
active
07877222
ABSTRACT:
A design structure for an apparatus for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs, is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature.
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Boerstler David W.
Chadwick Nathaniel R.
Hailu Eskinder
Peterson Kirk D.
Qi Jieming
International Business Machines - Corporation
O'Malley Mary C
Schechter Andrew
Talpis Matthew B.
Walder, Jr. Stephen J
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