Structure for a duty cycle measurement circuit

Details Structure for a duty cycle measurement circuit Structure for a duty cycle measurement circuit

2011-03-29

2011-03-29

Dunn, Drew A (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S079000, C702S089000, C702S107000, C702S125000, C702S176000, C702S178000, C327S174000, C327S175000

Reexamination Certificate

active

07917318

ABSTRACT:
A design structure for a circuit for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device is provided. The circuit has a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured by a same amount. The outputs of the pulse shaper elements may be coupled to substantially identical divider circuits whose outputs are coupled to a multiplexer that selects two inputs for output to a set of master/slave configured flip-flops, one input serving as a clock and the other as data to the flip-flops. The flip-flops sample the divider outputs selected by the multiplexer to detect if the dividers have failed or not. The outputs of the flip-flops are provided to an XOR gate which outputs a duty cycle signal indicative of the duty cycle of the input signal.

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