Structure and method to prevent over erasure of nonvolatile memo

Static information storage and retrieval – Floating gate – Particular biasing

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36518524, 36518518, 36518529, G11C 1140

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057744009

ABSTRACT:
A method and structure for preventing over erasure in non-volatile memory cells uses simultaneous erase and program current injections which offset one another. These currents come from two separate injection points within the non-volatile memory transistor and are dominant at different points during the erase operation. The first occurring current erases the non-volatile device and the second prevents over erasure.

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