Structure and method of making interconnect element, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package

Reexamination Certificate

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C257SE23062, C257SE23173

Reexamination Certificate

active

07923828

ABSTRACT:
An interconnect element is provided which includes a dielectric element having a first major surface, a second major surface remote from the first major surface, and a plurality of recesses extending inwardly from the first major surface. A plurality of metal traces are embedded in the plurality of recesses, the metal traces having outer surfaces substantially co-planar with the first major surface and inner surfaces remote from the outer surfaces. A plurality of posts extend from the inner surfaces of the plurality of metal traces through the dielectric element, the plurality of posts having tops exposed at the second major surface. A multilayer wiring board including a plurality of such interconnect elements is also provided, as well as various methods for making such interconnect elements and multilayer wiring boards.

REFERENCES:
patent: 5011580 (1991-04-01), Pan et al.
patent: 5118385 (1992-06-01), Kumar et al.
patent: 5440805 (1995-08-01), Daigle et al.
patent: 6262376 (2001-07-01), Hurwitz et al.
patent: 6262478 (2001-07-01), Hurwitz et al.
patent: 6280640 (2001-08-01), Hurwitz et al.
patent: 6780673 (2004-08-01), Venkateswaran
patent: 6838763 (2005-01-01), Ahn et al.
patent: 7052932 (2006-05-01), Huang et al.
patent: 2002/0074641 (2002-06-01), Towle et al.
patent: 2004/0000425 (2004-01-01), White et al.
Marriam—Webster's Colleciate Dictionary 10th edition, 1993, p. 891.
Partial International Search Report, PCT/US2005/035459, Dated Mar. 30, 2006.

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