Structure and method for FPN reduction in imaging devices

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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C257S072000, C257S443000

Reexamination Certificate

active

07808063

ABSTRACT:
Imaging devices having reduced fixed pattern noise are disclosed. The fixed pattern noise in the imaging devices is reduced by measuring and adjusting the spectral characteristics of the imager device on a pixel by pixel basis. The fixed pattern noise of the pixel cells are changed by modifying the absorption, reflectance, refractive index, shape, and/or micro structure of the material.

REFERENCES:
patent: 3971065 (1976-07-01), Bayer
patent: 5471515 (1995-11-01), Fossum et al.
patent: 6333205 (2001-12-01), Rhodes
patent: 6376868 (2002-04-01), Rhodes
patent: 6783900 (2004-08-01), Venkataraman
patent: 2003/0211405 (2003-11-01), Venkataraman

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