Data processing: measuring – calibrating – or testing – Measurement system
Reexamination Certificate
2007-09-04
2007-09-04
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Reexamination Certificate
active
11367802
ABSTRACT:
A system and method for identifying significant bivariate checkpoints. The system includes a controller configured to receive measurements for a plurality of checkpoints and calculate the covariance and correlation for each checkpoint pair. The controller identifies significant bivariate checkpoints based on the covariance between the checkpoint pairs. Further, the controller may also calculate the correlation for each checkpoint pair and identify the significant bivariate checkpoints based on a combination of the covariance and the correlation between the checkpoints. Further, the controller may rank the significant bivariate checkpoints and provide the significant bivariate checkpoints to a principal component algorithm.
REFERENCES:
patent: 6125235 (2000-09-01), Padilla et al.
patent: 2004127304 (2004-04-01), None
Gardavsky Jiri
Guo Yu
Krakowski Richard A.
Loferer Hannes
Roan Jim
Barlow John
Brinks Hofer Gilson & Lione
Cherry Stephen J
Perceptron, Inc.
LandOfFree
Structural data analysis system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Structural data analysis system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structural data analysis system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3738446