Strips for analyzing samples

Chemistry: electrical and wave energy – Apparatus – Electrolytic

Reexamination Certificate

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Details

C204S400000, C204S416000

Reexamination Certificate

active

07144485

ABSTRACT:
This invention relates to a strip for analyzing a sample. The strip includes two insulating layers, a spacer layer, and a conducting circuit. The spacer layer is disposed between the two insulating layers, and configured to define, together with the two insulating layers, an adsorption port, a sample chamber, a capillary for delivering a sample from the adsorption port to the sample chamber through the capillary, and a vent for facilitating delivery of the sample into the sample chamber. The conducting circuit, also disposed between the two insulating layers, includes a working electrode, a counter electrode, conducting wires, and connectors. A test agent, reactive to an analyte in a sample, is in association with the electrodes.

REFERENCES:
patent: 4545382 (1985-10-01), Higgins et al.
patent: 4711245 (1987-12-01), Higgins et al.
patent: 5120420 (1992-06-01), Nankai et al.
patent: 5264103 (1993-11-01), Yoshioka et al.
patent: 5282950 (1994-02-01), Dietze et al.
patent: 5320732 (1994-06-01), Nankai et al.
patent: 5437999 (1995-08-01), Diebold et al.
patent: 5509410 (1996-04-01), Hill et al.
patent: 5628890 (1997-05-01), Carter et al.
patent: 5650062 (1997-07-01), Ikeda et al.
patent: 5682884 (1997-11-01), Hill et al.
patent: 5727548 (1998-03-01), Hill et al.
patent: 5759364 (1998-06-01), Charlton et al.
patent: 5820551 (1998-10-01), Hill et al.
patent: 6120676 (2000-09-01), Heller et al.
patent: 6129823 (2000-10-01), Hughes et al.
patent: 6143164 (2000-11-01), Heller et al.
patent: 6241862 (2001-06-01), McAleer et al.
patent: 6258229 (2001-07-01), Winarta et al.
patent: 6270637 (2001-08-01), Crismore et al.
patent: 6299757 (2001-10-01), Feldman et al.
patent: 6413410 (2002-07-01), Hodges et al.
patent: 6447657 (2002-09-01), Bhullar et al.
patent: 6454921 (2002-09-01), Hodges et al.
patent: 6461496 (2002-10-01), Feldman et al.
patent: 6541216 (2003-04-01), Wilsey et al.
patent: 2002/0157947 (2002-10-01), Rappin et al.
patent: 2004/0224369 (2004-11-01), Cai et al.
patent: 0 537 761 (1993-04-01), None
patent: 0 685 737 (1995-12-01), None
patent: 1 260 589 (2002-11-01), None
patent: 11-352093 (1999-12-01), None
patent: WO 99/08106 (1999-02-01), None
JPO English language translation of Ikeda et al. (JP 11-352093 A).

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