Strip lay-up verification system with width and centerline skew

Details Strip lay-up verification system with width and centerline skew Strip lay-up verification system with width and centerline skew

1990-07-25

1992-06-09

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250561, G01N 2186

Patent

active

051209764

ABSTRACT:
A method and apparatus for monitoring characteristics of strips that are laid on a surface are disclosed. The method determines gaps and overlaps between adjacent strips on a surface by determining and analyzing the centerline skew and/or width of the strips near a common point of the surface. The method can be carried out during the strip lay-up process. The apparatus includes a sensor component and a controller. The sensor is positionable in close proximity to the point at which a strip is laid on a surface. Further, the sensor can be positioned on one side of the surface. The controller is in signal communication with said sensor component. The controller includes means for causing the sensor component to gather and transmit edge image signals. The controller receives the edge image signals and determines characteristics of the strip, such as centerline skew and width, as the strip appears on the surface. The characteristic information is analyzed to identify gaps or overlaps between adjacent strips.

REFERENCES:
patent: 2791931 (1957-05-01), Summerhayes, Jr.
patent: 3746451 (1973-07-01), Croissant et al.
patent: 3796492 (1974-03-01), Cullen et al.
patent: 3890509 (1975-06-01), Maxey
patent: 4033697 (1977-07-01), Pfoutz et al.
patent: 4223346 (1980-09-01), Neiheisel et al.
patent: 4240110 (1980-12-01), Henry
patent: 4319270 (1982-03-01), Kimura et al.
patent: 4367487 (1983-01-01), Klein et al.
patent: 4384303 (1983-05-01), Brenke et al.
patent: 4499383 (1985-02-01), Loose
patent: 4528630 (1985-07-01), Sargent
patent: 4641070 (1987-02-01), Pfizenmaier et al.
patent: 4641357 (1987-02-01), Satoh
patent: 4658144 (1987-04-01), Croyle
patent: 4675730 (1987-06-01), Adomaitis et al.
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 4731649 (1988-03-01), Chang et al.
patent: 4750835 (1988-06-01), McMurtry
patent: 4870291 (1989-09-01), Hayashi et al.

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