Strip inspecting apparatus and associated method

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined

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Details

73159, 118669, 118670, 118712, 118313, 427 8, 427286, B05D 102, B21D 5100, B31B 100

Patent

active

048658723

ABSTRACT:
Apparatus for inspecting strip including metal strip includes inspection elements for monitoring a plurality of properties of the strip, a transport unit for passing the strip by the inspection elements and signal generators on the inspection elements for emitting a signal to a strip processing unit which emits a signal to a strip marking unit when one or more properties departs from predetermined limits. The strip marking system provides markings in one or more of a plurality of longitudinal zones on the strip responsive to signals indicating that one or more properties have departed from the desired limits with the particular zone identifying the particular property. A strip edge detector determines the edge of the strip and an actuator positions the marking unit in the desired transverse position relative to the strip so as to establish the zones where desired. The system may provide a printout identifying undesired properties and the particular longitudinal section of the strip where these appear. A method of inspecting strip exemplified by the apparatus is also provided.

REFERENCES:
patent: 2246906 (1941-06-01), Viebahn et al.
patent: 2576043 (1951-11-01), Rendel
patent: 2930228 (1960-03-01), Lawrence et al.
patent: 3188478 (1965-06-01), Binks
patent: 3445672 (1969-05-01), Marks
patent: 3500437 (1970-03-01), Foerster
patent: 3619578 (1971-11-01), George
patent: 3633211 (1972-01-01), Batzdorff
patent: 3700909 (1972-10-01), Murray et al.
patent: 4004152 (1977-01-01), Obser et al.
patent: 4099482 (1978-07-01), Smrt
patent: 4204012 (1980-05-01), Brocklehurst et al.
patent: 4209120 (1980-06-01), Ruegg et al.
patent: 4229645 (1980-10-01), Vigano et al.
patent: 4304981 (1981-12-01), Gappa
patent: 4306808 (1981-12-01), Vander Neut
patent: 4329377 (1982-05-01), Voelker et al.
patent: 4514436 (1985-04-01), Moerschel
patent: 4578052 (1986-03-01), Engel et al.
patent: 4652329 (1987-03-01), Focke
patent: 4817424 (1989-04-01), Pellatiro

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