Stress relieved contact array

Details Stress relieved contact array Stress relieved contact array

2005-01-04

2005-01-04

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

06838894

ABSTRACT:
A large array probe/contact having spring characteristics for relieving stress in the contact caused, for example, by temperature change is fabricated using a unique combination of semiconductor fabrication operations. The contacts in the array have a “U” shaped resilient portion, are fixed at one end to a substrate and have an accessible low electrical noise contact tip. The contacts are encapsulated on the substrate in an elastomer to provide additional stress relief resilience, support and protection from damage during handling.

REFERENCES:
patent: 4998885 (1991-03-01), Beaman
patent: 5785538 (1998-07-01), Beaman et al.

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