Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1998-08-27
2000-10-24
Noori, Max
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73811, G01B 716
Patent
active
061349712
ABSTRACT:
The present invention is a novel electronic technique that detects stress/strain in any conductive or semiconductive material. The technique is based on passing a current through the material of interest and analyzing the low frequency voltage fluctuation. The voltage fluctuation is very sensitive to the amount of stress present in the sample. The voltage fluctuation is a result of interactions between the imposed current and material itself. The technique is many orders of magnitude more sensitive than any present method. The technique is suitable for sensitive measurements without a strain gauge. The technique is not limited by sample size, and provides a simple, fast, nondestructive and on-site evaluation of stress/strain in a material.
REFERENCES:
patent: 3434343 (1969-03-01), Senour
patent: 3965429 (1976-06-01), Roberts, III
patent: 4630491 (1986-12-01), Kitagawa et al.
patent: 4658233 (1987-04-01), Uchida et al.
patent: 4747456 (1988-05-01), Kitagawa et al.
patent: 4777826 (1988-10-01), Rud, Jr. et al.
patent: 4782705 (1988-11-01), Hoffmann et al.
patent: 4884453 (1989-12-01), Hoffmann et al.
patent: 5317920 (1994-06-01), Kremidas
patent: 5589770 (1996-12-01), Saitou
Misra et. al. A New Non-Destructive Characterization Technique (l/f Noise) For Detecting Fatigue In Metal Hydrogen Containers, Hydrgen Energy Progress X--Proceedings of the 10th World Hydrogen Energy Conference, Jun. 20-24, 1994, pp. 215-223, vol. I.
D.J. Bergman, "Electrical Transport Properties Near A Classical Conductivity or Percolation Threshold", Physica A 157 (1989) pp. 72-88.
Y. Song et al., "1/f noise power measurements on T1.sub.2 Ba.sub.2 Ca.sub.n-1 Cu.sub.n O.sub.4+2n (n=2 and 3)", Physica C 172 (1990) pp. 1-12.
P. Dutta et al., "Low-frequency fluctuations in solids:1/f noise", Reviews of Modern Physics, vol. 53, No. 3, Jul. 1981, pp. 497-516.
Gaines James R.
Misra Anupam
Rocheleau Richard
Song Steven
Noori Max
University of Hawai'i
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