Stress analyzer with automatic overload response

Details Stress analyzer with automatic overload response Stress analyzer with automatic overload response

1988-06-08

1989-05-09

Levy, Stewart J.

Thermal measuring and testing

Thermal testing of a nonthermal quantity

With loading of specimen

374 47, 374124, G01N 300

Patent

active

048284009

ABSTRACT:
An object stress analyzing system includes a scanning head with a detector, a variable gain amplifier and a control unit which controls the scanning head and which acquires stress-related data from the amplifiers. The control unit responds to detector overload conditions by automatically adjusting the gain of the amplifier, rescanning a portion of the object and rescaling data acquired prior to occurrence of the overload condition.

REFERENCES:
patent: 4541059 (1985-09-01), Toshihiko

Affiliated with

Also associated with

Rating

Stress analyzer with automatic overload response does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Stress analyzer with automatic overload response, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stress analyzer with automatic overload response will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-86241