Strain measuring device

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

73766, 324105, G01B 718

Patent

active

044048564

ABSTRACT:
A strain measuring device using a Wheatstone bridge circuit. An excitation voltage changing switch switches from one excitation voltage to a different excitation voltage in accordance with a controlling circuit providing sequence operation of them and of other circuit elements to remove spurious components affecting the measurement of strain. Such spurious components include potential errors due to thermal electromotive force produced inside or outside said Wheatstone bridge circuit and sensitivity error due to drift voltage occurring in the driver circuit of the bridge current source. A comparator may be used to effect judgment of the amount of the measured value of the voltmeter, so that the controlling circuit causes excitation voltage changing switch to select only two excitation voltages out of at least three for switching no matter how many excitation voltages are provided for in the bridge current supply source.

REFERENCES:
patent: 4012953 (1977-03-01), Ormond
patent: 4054835 (1977-10-01), Luos et al.
patent: 4174639 (1979-11-01), Raven

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Strain measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Strain measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Strain measuring device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-583090

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.