Measuring and testing – Dynamometers – Responsive to force
Patent
1992-03-05
1994-02-22
Chilcot, Jr., Richard E.
Measuring and testing
Dynamometers
Responsive to force
177211, G01L 100
Patent
active
052877574
ABSTRACT:
A strain-gauge transducer comprises a strain gauge enclosed between pressure members which deform the strain gauge, the strain gauge comprising a plate-shaped substrate provided with strain-detection elements. At least one spring having a flexibility larger than that of the substrate is arranged between the strain gauge and at least one of the pressure members, said substrate and said spring being in contact with one another so as to be jointly subjected to deformations. The spring may be a blade spring, a helical spring, or a cylindrical buffer spring. The excursions of the pressure members can be limited by means of stops. In the case of a blade spring the contact between the substrate and the spring can be controlled by giving the substrate a toothed shape or by providing it with contact elements.
REFERENCES:
patent: 3548650 (1970-12-01), Boadle
patent: 4175445 (1979-11-01), Templeton, III
patent: 4355692 (1982-10-01), Ostrelich
patent: 4433741 (1984-02-01), Ryckman, Jr.
patent: 4498070 (1985-02-01), Lirman
patent: 4650016 (1987-03-01), Andriewsky
patent: 4874051 (1989-10-01), Borchard
patent: 5088334 (1992-02-01), Wirth
"Strain Sensitivity of Thick-Film Resistors" J. S. Shah, IEEE Trans. CHMT-3 No. 4, p. 554.
Hazan Jean-Pierre
Maniguet Francois
Polaert Remy
Biegel R. L.
Botjer William L.
Chilcot Jr. Richard E.
U.S. Philips Corporation
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