Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1987-07-10
1988-11-08
Levy, Stewart J.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
338 32H, G01L 100, H01L 4306
Patent
active
047827050
ABSTRACT:
A strain gauge comprised of a premagnetized ferromagnetic film wherein any change in length of the film is converted into a planar Hall voltage by employing the property of magnetostriction and the planar Hall effect. Alternately, a change in the length of the film can also be measured as a change in electric conductivity by employing the properties of magnetostriction and magnetoresistance. The strain gauge is deposited on a substrate by thin-film techniques and has a very high sensitivity.
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patent: 4649755 (1987-03-01), Volz
J. Appl. Phys. 52(3), Mar. 1981, "Applicability of the Planar Hall Effect", pp. 2468-2470 (Author: Jan H. Fluitman).
Phys. Stat. Sol., 26, 585 (1968), "Planar Hall Effect in Ferromagnetic Films", pp. 565-569 (Author: Vu Dinh Ky).
Ort, The Latest In-Foil Strain Gauges Versus Thin Film Strain Gauges, Conference, 1978.
Tolman, "Monitoring the Magnetostriction of Thin Films During Vacuum Deposition", Review of Scientific Instruments, vol. 35, No. 6, 1964.
Hoffmann Horst
Kersten Peter
Seyfried Ulrich
Volz Hans
ALCATEL N.V.
Levy Stewart J.
Raevis Robert R.
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