Strain gage measurement circuit for high temperature application

Details Strain gage measurement circuit for high temperature application Strain gage measurement circuit for high temperature application

1981-05-01

1982-12-14

Myracle, Jerry W.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

Specified electrical sensor or system

338 3, G01B 716

Patent

active

043632432

ABSTRACT:
A measurement circuit and calibration technique for temperature compensating a half-bridge-high-temperature strain gage, capable of providing data which is independent of cable resistance variations.
The need for a compensating resistor is eliminated and the cable conductors are removed from the measurement circuit. The output signal is easily and accurately converted to a measurement of strain without the need for auxiliary measurement required with prior art circuitry.

REFERENCES:
patent: 3355935 (1967-12-01), Grosvalet
patent: 3662234 (1972-05-01), Ishii

Affiliated with

Also associated with

Rating

Strain gage measurement circuit for high temperature application does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Strain gage measurement circuit for high temperature application, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Strain gage measurement circuit for high temperature application will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1197415