Strain gage having a thin discontinuous metal layer

Details Strain gage having a thin discontinuous metal layer Strain gage having a thin discontinuous metal layer

1987-02-05

1989-03-14

Goldberg, E. A.

Electrical resistors

Strain gauge type

338 5, G01L 122

Patent

active

048128007

ABSTRACT:
A highly sensitive strain gage containing a thin discontinuous metal layer whose conduction effect is based predominantly on the tunnel effect and which is applied uniformly onto a thin, nonmetallic, dielectric or semiconducting substrate such as uniaxially oriented or partially crystalline plastic film, an ordered ultrathin layer or a silicone-coated plastic film, the diffusion processes in the applied metal layer being reduced and its structural stability improved as a result of interaction of the substrate with the metal layer.

REFERENCES:
patent: 2556132 (1951-06-01), Ball
patent: 2621276 (1952-12-01), Howland
Strain Gauge Technology, A. L. Window and G. S. Holister, Applied Science Publishers, Ltd., Essex, England (1982), pp. 1-38.
Advances in Physics 24, 407-461 (1975), Abeles et al., "Structural and Electrical properties of Granular Films."
Advances in Physics 34, 475-512 (1963), Roberts et al., "An Applied Science of Langmuir-Blodgett Films."
Journal of Applied Physics, 34, No. 9, (2700-2708), Sep. 1963, Parker and Krinsky, "Electrical Resistance-Strain Characteristics of Thin Evaporated Metal Films."

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