Strain detection for automated nano-manipulation

Details Strain detection for automated nano-manipulation Strain detection for automated nano-manipulation

2005-07-21

2008-07-08

Lefkowitz, Edward (Department: 2855)

Measuring and testing

Probe or probe mounting

C977S849000, C033S559000

Reexamination Certificate

active

07395727

ABSTRACT:
A strain detector for in-situ lift-out, comprises a nano-manipulator probe shaft; a strain gauge mounted on the probe shaft; and a first cut-out on the probe shaft. The first cut-out has a rectangular cross-section. There is a second cut-out on the probe shaft; the second cut-out having a semicircular cross-section. The second cut-out is positioned on the shaft opposite from the first cut-out; the first and second cut-out, thus defining a thinned region in the probe. The strain gauge is mounted on the probe shaft at the location of the thinned region. There is detecting circuitry for detecting, amplifying and conditioning the output of the strain gauge; and, wires electrically connecting the strain gauge to the detection circuitry. The wires are preferably located in a trench in the probe shaft. Other embodiments are disclosed having multiple strain gauges and detectors.

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Vishay Micro-Measurements. M-Bond 43-B Datasheet. Rev. Jan. 10, 2003. Accessed online on Dec. 4, 2007. <http://www.vishay.com/accessories/adhesives/>.

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