Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent
1995-06-05
1996-12-31
Chilcot, Richard
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
25022716, G01L 124
Patent
active
055896413
ABSTRACT:
A system and method for absolute, high resolution and accurate strain measurement includes a low-coherence light source (12) transmitting light through a strain sensor (18) and into an interferometer (26). The interferometer (26) has a high-coherence light source (48) that parallels the light from the low-coherence light source (12). The output of the interferometer is detected by a photodetector (46). The photodetector (46) is connected to a phase measuring circuit (30), that is in communication with a controller (28). The controller (28) is also connected to a motor (44) that adjusts the optical path lengths in the interferometer (38). The phase change in the high-coherence source from the fringe pattern (68) of the strain sensor (18) before and after a strain is applied to the device under test is used to determine the strain.
REFERENCES:
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patent: 4717253 (1988-01-01), Pratt, Jr.
patent: 5201015 (1993-04-01), Von Bieren et al.
patent: 5301001 (1994-04-01), Murphy et al.
patent: 5367583 (1994-11-01), Sirkis
patent: 5392117 (1995-02-01), Belleville et al.
Belk John H.
Johnson Bartley C.
Chilcot Richard
Halling Dale B.
McDonnell Douglas Corporation
Noori Max
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