Storage element for delay testing

Details Storage element for delay testing Storage element for delay testing

1993-10-08

1995-11-28

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 731, G01R 3100, G01R 3102

Patent

active

054711525

ABSTRACT:
A storage element for testing delay paths in integrated circuits is described. The storage element may be used in integrated circuits having matrices of probe and sense lines. The storage element generates a logic transition on an input to a delay path, the logic transition being closely synchronized with a clock signal. The storage element comprises a data input and a data output coupled to the input to the delay path. A master latch receives data from the data input through a first switch, the first switch being controlled by the complement of the clock signal. A slave latch receives data from the master latch through a second switch, the second switch being controlled by the true of the clock signal. A first sense input loads a first logic state into the master latch through a third switch, the first sense input being coupled to one of the IC's sense lines. The third switch is controlled by one of the IC's probe lines. A second sense input loads a second logic state into the slave latch through a fourth switch, the second sense input being coupled to another one of the IC's sense lines. The fourth switch is controlled by a second control signal. The second logic state replaces the first logic state in the slave latch upon application of the clock signal. The desired signal transition is generated where the first logic state is different from the second logic state.

REFERENCES:
patent: 4540903 (1985-09-01), Cooke et al.
patent: 4656649 (1987-04-01), Takahashi
patent: 4843254 (1989-06-01), Motegi et al.
patent: 5065090 (1991-11-01), Gheewala
B. I. Dervisoglu, et al., "Design for Testability: Using Scanpath Techniques for Path-delay Test and Measurement," IEEE Proceedings International Test Conference 1991, Paper 14.1, pp. 365-374.

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