Stippled lines using direct distance evaluation

Details Stippled lines using direct distance evaluation Stippled lines using direct distance evaluation

2007-04-13

2009-06-30

Amini, Javid A (Department: 2628)

Computer graphics processing and selective visual display system

Computer graphics processing

Shape generating

Reexamination Certificate

active

07554546

ABSTRACT:
Stippled lines are drawn by evaluating a distance function for a set of points within the area of a stippled line. The distance function gives a distance value proportional to the distance from a point to the end of the stippled line. Using the point's distance value, a pattern index value defines a correspondence between a point and at least one stipple pattern bit. The value of pattern bits are applied to the points on the stippled line, masking the points such that only a portion of the set of points are displayed or determining intensity values according to the position of the points within the stipple pattern. A distance function may be an edge equation associated with the line end or a segment of a polyline. The distance function can be evaluated for the set of points in any order, allowing portions of a stippled line to be drawn in parallel.

REFERENCES:
patent: 7221368 (2007-05-01), Crow et al.

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