Stiction resistant release process

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S110000, C438S115000

Reexamination Certificate

active

07087456

ABSTRACT:
A method of releasing a micro-electronic device formed over an insulator of a silicon-on-insulator (SOI) substrate. In one embodiment, the release method includes etching at least a portion of the insulator to separate the micro-electronic device from the SOI substrate, rinsing at least the micro-electronic device, exposing at least the micro-electronic device to a micro-sphere solution and removing the micro-electronic device from the SOI substrate. The release method may also include exposing the micro-electronic device to an etching plasma to substantially expunge the micro-sphere solution.

REFERENCES:
patent: 5750420 (1998-05-01), Bono et al.
patent: 6538296 (2003-03-01), Wan

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Stiction resistant release process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Stiction resistant release process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stiction resistant release process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3632695

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.