Stereoscopic three-dimensional metrology system and method

Details Stereoscopic three-dimensional metrology system and method Stereoscopic three-dimensional metrology system and method

2007-06-12

2007-06-12

Mehta, Bhavesh M (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S141000, C382S154000, C382S287000, C356S401000

Reexamination Certificate

active

10323720

ABSTRACT:
A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.

REFERENCES:
patent: 5537204 (1996-07-01), Woodhouse
patent: 6064756 (2000-05-01), Beaty et al.
patent: 6134975 (2000-10-01), Keil
patent: 6377701 (2002-04-01), Ohki

Affiliated with

Also associated with

Rating

Stereoscopic three-dimensional metrology system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Stereoscopic three-dimensional metrology system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stereoscopic three-dimensional metrology system and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3815517