Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-04-08
1995-08-15
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356371, G01N 2117
Patent
active
054424437
ABSTRACT:
A system operative with photon tunneling microscopy presents an image on a two-dimensional display which is perceived as a three-dimensional presentation by a person viewing the display. An optical image of the subject produced by the microscope is scanned by means of a television vidicon which converts the optical signal to an electric signal representing depth of a surface feature. The electric signal is outputted to the display wherein the image is presented as a set of line scans parallel to the horizontal axis of the display, and wherein the magnitude of the electric signal is plotted on the vertical axis of the display. A variable delay is introduced to be either increased or decreased stepwise between successive ones of the line scans. This results in a tilting of the presentation to the right or the left. Two tilted views are presented simultaneously, one to one eye and one to the other eye of an observer, to give a perception of a three-dimensional view. A flexible optical transducer between the subject and an objective lens provides a conformal fitting of the microscope to the subject. A film of oil is placed between and contiguous the lens and the flexible optical element to provide continuity of optical path. The transducer is provided with a scale formed as a depression in its surface and having a sequence of steps which serves as a measure of height of topographical features on the subject.
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Caufield Francis J.
Pham Hoa Q.
Polaroid Corporation
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