Step scanning technique for interferometer

Details Step scanning technique for interferometer Step scanning technique for interferometer

1991-05-22

1992-11-24

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

318640, G05B 106

Patent

active

051667495

ABSTRACT:
A fast and effective way to step a relative position quantity by a reference interval. Each step in relative position includes open-loop and closed-loop control intervals. The invention contemplates an actuator capable of changing the relative position and a closed loop servo that acts on the actuator to keep the relative position centered on the nearest one of a series of reference values separated by the reference interval. The actuator is preferably capable of a fast response. Stepping the relative position is accomplished as follows, assuming an initial condition where the servo has locked the relative position to a particular initial reference value. First, the actuator is caused to change the relative position by an amount approximately equal to the reference interval in a manner that the servo cannot track the change, such as by disabling the servo. Servo control is then re-established, at which point the servo operates to keep the relative position centered on the nearest reference value. Servo control is maintained until a new step is required, at which time the process is repeated.

REFERENCES:
patent: 4444501 (1984-04-01), Schwiesow
P. Connes et al., "Astronomical Fourier Spectrometer", Applied Optics, vol. 14, No. 9, Sep. 1975, pp. 2067-2084.
M. Smith et al., "Step Scan Interferometry in the . . . ," Applied Spectroscopy, vol. 42, No. 4, 1988, pp. 546-555.

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