Statistical method of generating a synthetic hologram from...

Details Statistical method of generating a synthetic hologram from... Statistical method of generating a synthetic hologram from...

2005-07-29

2008-11-25

Chowdhury, Tarifur R (Department: 2886)

Optics: measuring and testing

By light interference

For dimensional measurement

Reexamination Certificate

active

07456976

ABSTRACT:
Multiwavelength interferometric images have the phase and/or frequency of the illuminating light corrected by statistically analyzing the data, and adjusting the phase and/or frequency until a statistical measure reaches a criterion.

REFERENCES:
patent: 5907404 (1999-05-01), Marron
patent: 5926277 (1999-07-01), Marron et al.
patent: 2003/0142317 (2003-07-01), Mater
patent: 2005/0002041 (2005-01-01), Mater
patent: 2007/0024866 (2007-02-01), Nisper
patent: 2007/0024867 (2007-02-01), Mater

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