Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-01-11
2011-01-11
Bhatnagar, Anand (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S181000, C382S195000, C382S197000, C382S199000, C382S224000, C382S228000
Reexamination Certificate
active
07869656
ABSTRACT:
A statistical image processing system and method for detecting an original image feature and/or a noise feature in an input image using a statistical hypothesis test, thereby estimating the image or noise when an original image is contaminated with the noise, and a recording medium for recording the method, are provided. The method enables existence
on-existence of an image
oise feature in an input image to be accurately detected without information on the magnitude of a sample variance of noise in the input image. In addition, according to the method, the relative amount of noise and/or image feature can be numerically expressed and can be used in the various fields of image processing application.
REFERENCES:
patent: 4991092 (1991-02-01), Greensite
patent: 2003/0179213 (2003-09-01), Liu
patent: 2005/0069223 (2005-03-01), Tanimura et al.
Bhatnagar Anand
Chu Randolph
Chung-Ang University Industry Academic Cooperation Foundation
Harness & Dickey & Pierce P.L.C.
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