Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-03-16
1996-10-15
Gonzalez, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356345, G01B 902
Patent
active
055659861
ABSTRACT:
Interferometer apparatus includes a light source, disposed in a light source arm, for emitting light at various wavelengths and a focusing device disposed in an object arm for focusing the emitted light simultaneously into at least two different regions within an object, the focused light being reflected from the object. A reference is provided, including a reflective element, for reflecting light from the light source means and a detector, disposed in a detector arm is provided for measuring different wavelengths of the light reflected from the reference means and the object, in order to obtain a spectroscopic image of the object, displaying both spacial resolution in a lateral direction and a field of view in a depth direction.
REFERENCES:
patent: 3702735 (1972-11-01), Potter
patent: 5192980 (1993-03-01), Dixon et al.
Gonzalez Frank
Hackler Walter A.
Merlino Amanda
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