Static timing based IR drop analysis

Details Static timing based IR drop analysis Static timing based IR drop analysis

2005-09-29

2009-08-11

Rodriguez, Paul L (Department: 2123)

Data processing: structural design, modeling, simulation, and em

Simulating electronic device or electrical system

Circuit simulation

C703S022000, C702S064000, C716S030000

Reexamination Certificate

active

07574344

ABSTRACT:
A method for determining a maximum IR drop on a power grid of a circuit is disclosed. The method includes dividing a reference timing signal into multiple bins. Each one of the bins having a corresponding bin duration. The bins being divided by a corresponding fuzzy boundaries. Each one of the fuzzy boundaries having a corresponding boundary duration. Each one of the of bins is analyzed including selecting one of the bins, identifying a first set devices that transition to their corresponding maximum current states during the selected bin and identifying a second set of devices that transition to their corresponding maximum current states during at least one of the boundaries of the selected bin, but not within the selected bin. A maximum current demand equal to a sum of the maximum current states of the first and second plurality of devices is calculated. A system for testing a circuit is also disclosed.

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