Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-09-26
2010-12-21
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C715S734000
Reexamination Certificate
active
07856327
ABSTRACT:
A State and Topology Processor (STP) may be communicatively coupled to one or more intelligent electronic devices (IEDs) communicatively coupled to a electrical power system to obtain one or more current measurements, voltage measurements, and dynamic topology data therefrom. The STP may receive the measurement data and may determine a current topology and a voltage topology therefrom. A current processor may use the current topology and the current measurements to refine the measurements, perform KCL, unbalance, symmetrical component, and consistency checks on the electrical power system. The voltage processor may use the voltage topology and the voltage measurements to perform similar checks on the electrical power system. One or more alarms may be generated responsive to the checks. The data may be displayed to a user in a display of a human machine interface and/or may be transmitted to a user programmable task module, and/or an external control unit.
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Donolo Marcos A.
Guzman-Casillas Armando
Schweitzer, III Edmund O.
Raymond Edward
Schweitzer Engineering Laboratories Inc.
Stoel Rives LLP
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