Standing wave luminescence microscopy

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G02B 2106

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046219110

ABSTRACT:
An optical microscope and a method are described wherein a luminescent specimen is located in, and illuminated by, a nodal standing wave field. Luminescence (fluorescence or phosphorescence) is excited in a series of parallel equispaced laminar antinodal zones separated by a series of dark nodal zones that span the specimen. By controlling the node spacing and phase of the standing wave field, a set of luminescence images of the specimen can be observed and recorded. Means can be provided for computing a three-dimensional distribution of light emitters within the specimen from this set of images.

REFERENCES:
patent: 4311358 (1982-01-01), Gibbons et al.
patent: 4525858 (1985-06-01), Cline et al.
SPIE vol. 190 LASL Optics Conference (1979), Improved Dark-Field-Like Surface Inspection Technique Using Total Internal Reflection, by P. A. Temple, pp. 44-51.
Applied Optics vol. 20, No. 15, 1981, Total Internal Reflection Microscopy: A Surface Inspection Technique, by P. A. Temple, pp. 2656-2664.
"X-ray Standing Waves in Garnet Crystals" by S. Lagomarsino, F. Scarinci and A. Tucciarone, Physical Review, vol. 29, No. 9, May 1, 1984, pp. 4859-4863.

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