Standard component for calibration and calibration method...

Details Standard component for calibration and calibration method... Standard component for calibration and calibration method...

2007-05-07

2010-11-16

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Standard

C356S401000, C250S311000, C250S252100

Reexamination Certificate

active

07834997

ABSTRACT:
The positions of diffraction gratings used for calibration can be checked easily by arranging marks near the diffraction gratings, the marks indicating the coordinate positions of the diffraction gratings. Dummy patterns including a pattern of cross marks are arranged around the array of the diffraction gratings. Consequently, a uniform diffraction grating pattern is accomplished in which the proximity effect is uniform across the diffraction grating array. Furthermore, cross marks can be disposed adjacent to the diffraction grating array. Therefore, the diffraction gratings can be placed in position and calibrated accurately and easily by using a standard component capable of realizing accurate positioning of the diffraction gratings. Hence, accurate metrology calibration coping with the next generation of semiconductor lithography technology can be accomplished.

REFERENCES:
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patent: 7365306 (2008-04-01), Nakayama
patent: 2002/0158193 (2002-10-01), Sezginer et al.
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patent: 2008/0198467 (2008-08-01), Nakayama
patent: 2004-251682 (2004-09-01), None
patent: 2004-340838 (2004-12-01), None
patent: 2005-241328 (2005-09-01), None

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