Standard cell having test pad for probing and semiconductor inte

Details Standard cell having test pad for probing and semiconductor inte Standard cell having test pad for probing and semiconductor inte

1989-01-23

1991-04-16

Mintel, William

Excavating

357 45, 357 41, 357 68, 371 151, 371 226, H01L 2702

Patent

active

050087274

ABSTRACT:
A cell containing a test pad is defined as a standard cell, in the same fashion as a logic circuit, and is disposed and wired, together with logic circuit cells, in the internal circuit region excluding the input and output pad regions around the chip by a standard cell system. The cell containing the test pad possesses the pad region for feeding a reference potential in the cell, or the pad region capable of detecting a reference signal, or the layout pattern for expressing an arbitrary code for distinguishing the cell from other cells.

REFERENCES:
patent: 4413271 (1983-11-01), Gontowski, Jr. et al.
patent: 4768073 (1988-08-01), Adams
patent: 4866508 (1989-09-01), Eichelberger et al.
patent: 4870300 (1989-09-01), Nakaya et al.

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